Rigid design of fast scanning probe microscopes using finite element analysis.
نویسندگان
چکیده
To improve the performance of atomic force microscopes regarding speed and noise sensitivity, it is important to consider the mechanical rigidity of the actuator (scanner), and the overall mechanical structure. Using finite element analysis in the design process, it was possible to increase the first resonance frequency from 950 Hz for the whole system to 23.4 kHz for the whole system. This constitutes a factor of approximately 25 in resonance frequency and a factor of 625 in stiffness and, hence, noise immunity.
منابع مشابه
A Compact Vertical Scanner for Atomic Force Microscopes
A compact vertical scanner for an atomic force microscope (AFM) is developed. The vertical scanner is designed to have no interference with the optical microscope for viewing the cantilever. The theoretical stiffness and resonance of the scanner are derived and verified via finite element analysis. An optimal design process that maximizes the resonance frequency is performed. To evaluate the sc...
متن کاملCompact ultra-fast vertical nanopositioner for improving scanning probe microscope scan speed.
The mechanical design of a high-bandwidth, short-range vertical positioning stage is described for integration with a commercial scanning probe microscope (SPM) for dual-stage actuation to significantly improve scanning performance. The vertical motion of the sample platform is driven by a stiff and compact piezo-stack actuator and guided by a novel circular flexure to minimize undesirable mech...
متن کاملSimulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element analysis.
Piezoelectric tube scanners are widely used in scanning probe microscopes to position the sample or the probe. Fast and accurate scanning requires the suppression of dominant low-frequency resonances as well as the compensation of dynamics-coupling effects. The present article gives a detailed description of the fully coupled tube scanner dynamics over a wide frequency range modeled by finite e...
متن کاملDesign of a compact atomic force microscope to enhance scanning speed
A novel design of an atomic force microscope (AFM) with a (1-x)Pb(Mg1/3Nb2/3)O3-xPbTiO3 (PMN-PT) single crystal scanner and a self-sensing cantilever is presented in this paper. The piezoelectric scanner and the self-sensing cantilever are integrated into a small-sized all-in-one structure with a microscope objective focused on the tip. The Z-scanner consists of two parallel PMN-PT unimorphs. T...
متن کاملStudying of various nanolithography methods by using Scanning Probe Microscope
The Scanning Probe Microscopes (SPMs) based lithographic techniques have been demonstrated as an extremely capable patterning tool. Manipulating surfaces, creating atomic assembly, fabricating chemical patterns, imaging topography and characterizing various mechanical properties of materials in nanometer regime are enabled by this technique. In this paper, a qualified overview of diverse lithog...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- Ultramicroscopy
دوره 100 3-4 شماره
صفحات -
تاریخ انتشار 2004